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Important Breakthroughs in Digital Audio Interface Testing
Mr. Stephen Peterson

Monday, 18 November 1996

reported by: Mr. Jibby Jacob
                  Secretary (Term 1996/97)

On Monday evening 18 Nov 1996, a total of 8 AES members and 30 guests gathered at Ngee Ann Polytechnic MD's Lodge to attend a seminar on audio test and measurement. This seminar was jointly organised by AES Singapore Section, IEE Singapore Centre & TME Systems Pte. Ltd. 

Mr Stephen Peterson, International Sales Manager for Audio Precision, Beaverton, Oregon USA, spoke at length on testing and measurement of Digital Interfaces. Starting with the fundamentals of Serial Digital Interface and the format of the AES/ EBU digital audio signal, he went on to its sub-frame structure. In this respect his clear and precise explanations on the digital word assembly into serial frames, the need for the Validity, User, Channel status and Parity bits in the sub frames, was enlightening for both the students and the professionals in the audience. Moving on to test instrument requirements for high resolution A/D & D/A convertor testing, the conventional parameters were discussed. 

Using the Audio Precision-System Two audio analyser which Mr Peterson claimed is the only test measurement with complete implementation of the AES3 standard. Practical examples were demonstrated of what data jitter looks like and its measurement. 
 

Mr. Steve Peterson of Audio Precision, USA, presents to an audience comprising of AES/IEE members and guests on the Important Breakthroughs in Digital Audio Interface Testing - photograph by Dr. Roland K C Tan.

In addition, test instrument requirements for high resolution A/D and D/A convertor testing was also reviewed. The specifications discussed included A/D as well as D/A THD, dynamic range, frequency response & weighted noise requirements. 

However, he cautioned that the human ear should be used in conjunction with pure measurements to identify & locate the equipment's problem. Especially in codecs measurement, using conventional single simple sinewave is not adequate for testing instead he proposed using program-like test signal , eg a synchronous multi-tone signal with adjustable frequency amplitude distribution, having the complexity equivalent to voice or music signal. 
 

Steve further establishes a very good rapport with his audience during the question-and-answer session after his talk - photograph by Dr. Roland K C Tan. 

Hands on sessions on the System Two allowed attendees a close up on what was taught. This brought the fine seminar to a close. We wish to thank both TME systems who brought the speaker and IEE for their participation in this seminar.

 


Copyright 1996 AES Singapore Section